Park AFM Sample Measurement Request

   

Modes available on the FX-40 for sample measurements:


  • Topography Measurements
  • Electrostatic/Magnetic Force Microscopy
  • Kelvin Probe Force Microscopy
  • Conductive Atomic Force Microscopy
  • Scanning Capacitance Microscopy
  • High Voltage Piezoresponse
  • High Voltage Conductive Atomic Force Microscopy

Contact

Company, department, lab, etc.

If applicable

Sample Details

Material type, expected dimensions, features size.

Do you plan to measure in*

Scheduling

Please select all of the times you are available for measurements.

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